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Dr. Kyeongtae Kim

Kyeongtae-Kim

Part-time researcher of Division of Thermal and Fluids Science

H-Index (Scopus): 11; Citation (Scopus): > 670 


 

1. EDUCATION/TRAINING

  • Bachelor of Science, Mechanical Engineering, Hong-ik University, Korea, 2003
  • Master, Mechanical Engineering/ Nano Thermal Engineering, Korea University, Korea, 2006
  • Ph.D. Mechanical Engineering/ Nano Thermal Engineering, Korea University, Korea, 2010

2. WORKING HISTORY

  • From 2010 to 2011: Postdoctoral fellow, Seoul National University, Korea.
  • From 2011 to 2015: Research Scientist, University of Michigan, Ann Arbor.
  • From 2015 to 2017: Assistant professor, Incheon National University, Korea.
  • From 2017 to now: Associate professor, Incheon National University, Korea.

3. RESEARCH INTERESTS

Nano-Atomic Scale Energy Transport & Conversion and Thermal Science & Engineering

  • Heat dissipation & transfer in nano-atomic scale
  • Thermoelectric energy conversion in nano-atomic scale 
  • Energy transport in nano materials
  • Novel thermo-physical properties in nano-atomic materials
  • Scanning Tunneling-Thermal Microscopy
  • Ultra-High Vacuum Scanning Thermal Microscopy

4. RESEARCH PROJECTS

[7]. Embedded system development technology to control liquid precision / quantity dispensing (Principal Investigator), Misitry of SMEs and Startups, from 8/2018 (9 months) (Ongoing)

[6]. Development of high precision pneumatic dispenser system (Principal Investigator), Misitry of SMEs and Startups, from 6/2018 (12 months) (Ongoing)

[5]. Development of radioactive calorimetry for micro-activity detection of spent fuel dry storage tank (Principal Investigator), National Research Foundation (NRF), from 7/2018 (6 months) (Ongoing)

[4]. Atomic scale scanning thermal microscopy for probing energy transport (Principal Investigator), National Research Foundation (NRF), from 3/2018 (48 months) (Ongoing)

[3]. Minialization of smart phone-supplementary battery unit with thermal design (Principal Investigator), Misitry of SMEs and Startups, from 10/2017 (9 months) (Completed)

[2]. Measurement of phonon’s transport characteristics using ultra high accurate scanning thermal microscopy (Principal Investigator), National Research Foundation (NRF), from 11/2015 (36 months) (Ongoing)

[1]. Development of high vacuum scanning thermal microscopy with 10 nm spatial resolution (Principal Investigator), Misitry of SMEs and Startups, from 10/2015 (12 months) (Completed)

5. PUBLICATIONS

  • Journals: 

[18]. Kyeongtae Kim, Bai Song, Víctor Fernández-Hurtado, Woochul Lee, Wonho Jeong, Longji Cui, Dakotah Thompson, Johannes Feist, MT Homer Reid, Francisco J García-Vidal, Juan Carlos Cuevas, Edgar Meyhofer, Pramod Reddy, Radiative heat transfer in the extreme near field, Nature, 528 (7582): 387-391, (2015) (ISI)

[17]. Kyeongtae Kim, Wonho Jeong, Woochul Lee, Seid Sadat, Dakotah Thompson, Edgar Meyhofer, Pramod Reddy, Quantification of thermal and contact resistances of scanning thermal probes, Applied Physics Letters, 105(20): 203107, (2014) (ISI)

[16]. Youngsang Kim, Wonho Jeong, Kyeongtae Kim, Woochul Lee, Pramod Reddy, Electrostatic control of thermoelectricity in molecular junctions, Nature Nanotechnology, 9(11): 881-885, (2014) (ISI)  

[15]. Wonho Jeong, Kyeongtae Kim, Youngsang Kim, Woochul Lee, Pramod Reddy, Characterization of nanoscale temperature fields during electromigration of nanowires, Scientific reports, 4: 4975, (2014) (ISI) 

[14]. Linda A Zotti, Marius Bürkle, Fabian Pauly, Woochul Lee, Kyeongtae Kim, Wonho Jeong, Yoshihiro Asai, Pramod Reddy, Juan Carlos Cuevas, Heat dissipation and its relation to thermopower in single-molecule junctions, New Journal of Physics, 16(1): 015004, (2014) (ISI)

[13]. Woochul* Lee, Kyeongtae* Kim, Wonho Jeong, Linda Angela Zotti, Fabian Pauly, Juan Carlos Cuevas, Pramod Reddy, Heat dissipation in atomic-scale junctions, Nature, 498 (7453): 209, (2013) (ISI)

[12]. Y Ganjeh, B Song, K Pagadala, K Kim, S Sadat, W Jeong, K Kurabayashi, E Meyhofer, P Reddy, A platform to parallelize planar surfaces and control their spatial separation with nanometer resolution, Review of Scientific Instruments, 83(10): 105101, (2012) (ISI)

[11]. Byeonghee Lee, Kyeongtae Kim, Seungkoo Lee, Jong Hoon Kim, Dae Soon Lim, Ohmyoung Kwon, Joon Sik Lee, Quantitative Thermopower Profiling across a Silicon p-n Junction with Nanometer Resolution, Nano Letters, 12(9): 4472-4476, (2012) (ISI)

[10]. Kyeongtae Kim, Wonho Jeong, Woochul Lee, Pramod Reddy, Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry, ACS nano, 6(5): 4248-4257, (2011) (ISI)

[9]. Jaehun Chung, Kyeongtae Kim, Gwangseok Hwang, Ohmyoung Kwon, Young Ki Choi, Joon Sik Lee, Quantitative temperature profiling through null-point scanning thermal microscopy, International Journal of Thermal Sciences, 62: 109-113, (2011) (ISI)

[8]. Kyeongtae Kim, Jaehun Chung, Gwangseok Hwang, Ohmyoung Kwon, Joon Sik Lee, Quantitative measurement with scanning thermal microscope by preventing the distortion due to the heat transfer through the air, ACS nano, 5(11): 8700-8709, (2011) (ISI)

[7]. Jaehun Chung, Kyeongtae Kim, Gwangseok Hwang, Ohmyoung Kwon, Seungwon Jung, Junghoon Lee, Jae Woo Lee, Gyu Tae Kim, Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method, Review of Scientific Instruments, 81(11): 114901, (2010) (ISI)

[6]. Jaehun Chung, Kyeongtae Kim, Gwangseok Hwang, Ohmyoung Kwon, Joon Sik Lee, Seung Ho Park, Young Ki Choi, Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave, Review of Scientific Instruments, 81(5): 053701, (2010) (ISI)

[5]. Byeonghee Lee, Joon Sik Lee, Sun Ung Kim, Kyeongtae Kim, Ohmyoung Kwon, Seungkoo Lee, Jong Hoon Kim, Dae Soon Lim, Simultaneous measurement of thermal conductivity and interface thermal conductance of diamond thin film, Journal of Vacuum Science & Technology B, 27(6): 2408-2412, (2009) (ISI)

[4]. Kyeongtae Kim, Jaehoon Chung, Jongbo Won, Ohmyoung Kwon, Joon Sik Lee, Seung Ho Park, Young Ki Choi, Quantitative scanning thermal microscopy using double scan technique, Applied Physics Letters, 93(20): 203115, (2008) (ISI)

[3]. Kyeongtae Kim, Jisang Park, Sun Ung Kim, Ohmyoung Kwon, Joon Sik Lee, Seungho Ho Park, Young Ki Choi, Thermopower profiling of a silicon p-n junction, Applied Physics Letters, 90(4): 043107, (2007) (ISI)

[2]. Hee Hwan Roh, Joon Sik Lee, Dong Lib Kim, Jisang Park, Kyeongtae Kim, Ohmyoung Kwon, Seung Ho Park, Young Ki Choi, Arun Majumdar, Novel nanoscale thermal property imaging technique: the 2ω method. I. principle and the 2ω signal measurement, Journal of Vacuum Science & Technology B, 24: 2398, (2006) (ISI)

[1]. Hee Hwan Roh, Joon Sik Lee, Dong Lib Kim, Jisang Park, Kyeongtae Kim, Ohmyoung Kwon, Seung Ho Park, Young Ki Choi, Arun Majumdar, Novel nanoscale thermal property imaging technique: the 2ω method. II. demonstration and comparison, Journal of Vacuum Science & Technology B, 24:2405, (2006) (ISI)